Gerätedetails

Test uint electromigration
Versuchsstand
Measurement equipment
Accelerated aging
Diagnostics
Electr. charaterisation
Reliability testing
IAVT
(kein Bild verfügbar - no image available)

Conducting structure are loaded with an electrical current and, if applicable, a higher temperature. To reduce so called "Joules heating" a pulsed and puls width modulated electrical load can be used. After a subsequent metallographic preparation degradation can be investigated and classified as a result of electromigration resp. thermal migration.

  • Max. DC voltage: 15 V
  • Max. DC current: 60 A
  • Pulse frequency 10 Hz
  • Pulse width 0,2…1
  • Temperature RT…150 °C
  • 4 independent test chambers available
  • In-situ electrical measurement (128 channels, accuracy: µV, 2 µΩ)
Meier, Karsten, Dr.-Ing.
T: (0351) 463 36594
WHB E63

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